ÃÛÌÒ´«Ã½ÆÆ½â°æÏÂÔØ
Skip to main content
Translate
English
Spanish
Chinese
French
German
Korean
Lao
Nepali
Japanese
Tibetan
Search
Enter the terms you wish to search for.
Other ways to search:
Campus Map
Colorado Shared Instrumentation in Nanofabrication and Characterization (COSINC)
College of Engineering and Applied Science
Home
ÃÛÌÒ´«Ã½ÆÆ½â°æÏÂÔØ
People
Facilities
Research and Publications
Resource Scheduler & Rates
News & Events
Vision & Mission
Woollam M2000 Spectroscopic Ellipsometry for Thin Film Characterization
You must have JavaScript enabled to use this form.
Indicates required field
First and Last Name
First
Last
Email
Affiliation
Which session will you be attending?
Ìý
Morning and Afternoon
Ìý
Afternoon
In-Person or Virtual
Ìý
In-Person
Ìý
Virtual
We will send a link to the Zoom to the email you provided a week before.
Are you bringing your own samples to the morning session?
Ìý
Yes
Ìý
No
Field of Research
Your experience with ellipsometer
Ìý
Beginner
Ìý
Intermediate
Ìý
Advanced
Any dietary restrictions or allergies?
If you will be attending the afternoon session, please input any dietary restrictions or allergies.