COSINC Training series: Woollam M2000 Spectroscopic Ellipsometry for Thin Film Characterization
Date: Friday, February 27
Location: SEEL 303
Spectroscopic ellipsometry is an optical characterization technique used to measure the thickness and optical properties of thin films. The University of Colorado has purchased an M-2000 model V spectroscopic ellipsometer from the J.A. Woollam Company, and training will be conducted throughout the day. The instrument was acquired through the NSF National Quantum Nanofab (NQN) Award.Ìý
Morning Session --- Data Acquisition:
Location: SEEL 168
Training: 9:30²¹³¾-11:30²¹³¾ÌýÌýÌýÌýÌýÌý
Come learn how to collect measurements on the instrument. Involves hands-on practice of sample alignment and data collection. Due to limited space in the cleanroom, there are only 10 spots available for the morning session and attendance to the afternoon session is expected.Ìý
Lunch: 12pm-1pm
Afternoon Session --- Data Analysis:
Location: SEEL 303
Training: 1:00pm-5:00pm
There are 10 more spots in-person for the afternoon session, once these are filled those who opted for in-person will be given the Zoom link to attend virtually.Ìý
The training will cover these topics:ÌýÌýÌýÌýÌý
- Theory and basics of ellipsometry
- Data Analysis Procedures
- Examples of common thin film types
Model: M-2000 V
Wavelengths: 370 – 1000 nm
Angles (automated): 45 - 90°
Focused beam diameter: 220ÌýμmÌý
James N. Hilfiker
James N. Hilfiker graduated from the EE department of the University of Nebraska in 1995, where he studied under Professor John Woollam. He joined the J.A. Woollam Company, where he is now the Director of Applications. His research has focused on new applications of ellipsometry, including the characterization of anisotropic materials, liquid crystal films, thin-film photovoltaics, and Mueller matrix optical characterization. His work has resulted in over 140 publications and multiple book contributions. He was recognized by the Royal Society of Chemistry in 2022 with their Horizon Prize for discoveries in chiral organic materials that enable precise control of photon and electron spin. In 2025, he received the Nathaniel Sugerman Memorial Award from the Society of Vacuum Coaters for his contributions as a mentor, educator, and innovator.
Ìý Ìý ÌýIn 2016, James co-authored a book titled “Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization.â€
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